SLMKIT (The Structured Light Metrology Toolkit)
The Structured Light Metrology (SLM) Toolkit, or 'SLMkit', includes tools for simulating and optimizing the performance of structured light scanners (such as the GOM ATOS Q).
Background
Structured light metrology systems can provide a precise digital
reconstruction of real-world objects through projected light
patterns and a camera system. To make these 3D scanning
systems more efficient, there is a method to automate a robust
search for optimal exposure time with minimal human intervention
and judgment.
Description
The Structured Light Metrology (SLM) Toolkit, or 'SLMkit',
includes tools for simulating and optimizing the performance of
structured light scanners (such as the GOM ATOS Q). Other tools
include calculating the transformation matrix between a scanner's
coordinate system and the part's coordination system, simulating
a scan of the part under ideal circumstances (including through a
window), and calculating a quality metric to evaluate a scan in
comparison to the simulation.
Advantages
Reduced manufacturing costs due to automating some of the manual
tasks of 3D scanning a part using structured light technology.
Potential Applications
- 3D scanning/imaging
- Manufacturing simulation
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swap_vertical_circlelibrary_booksReferences (1)
- Nishant Ojal, Alex Caviness, Alexander Blum, Brian Au, Adam W. Jaycox, Brian Giera (2024), Optimizing exposure times of structured light metrology systems using a digital twin, Measurement, 224, 113816
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swap_vertical_circlecloud_downloadSupporting documents (1)Product brochureSLMKIT (The Structured Light Metrology Toolkit).pdfAdditional files may be available once you've completed the transaction for this product. If you've already done so, please log into your account and visit My account / Downloads section to view them.